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current version of Sandia's Xyce™ Parallel Electronic
Simulator, Release 2.1, is a release that has obtained
enough capability, stability and performance to be competitive
with and, in many areas, outperform existing circuit
simulation tools available from a variety of venues.
This version of Xyce™ represents four years of
development as part of the High Performance Electrical
Modeling and Simulation (HPEMS) effort, funded primarily
by DOE's ASCI Applications program at Sandia National
Laboratories. The project and software now gives Sandia
a modern, in-house simulation tool on which to build
future enhancements targeted at the design and analysis
needs of Sandia's electrical design community. In this
context, Release 2.0 is the most recent step in an ongoing
long term commitment to Sandia. In providing future
enhancements, we will continue to rely on help from
the larger modeling and simulation community at Sandia,
including ASCI Materials and Physics Modeling (M&PM),
Algorithms and the Computer Science Research Institute
(CSRI) researchers. This plan forward will result in
a leading-edge electrical modeling tool for Sandia. |
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Xyce™
Current/Near-term Critical & Unique Capabilities
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| Capability |
Delivery Dates |
|
Prototype |
Beta
|
Released |
| Multi-Time
PDE |
Q3FY03 |
Q2FY04 |
Q4FY05 |
| Key
Features |
For
circuits with quasi-periodic signals (e.g.,
firing-set charging circuits), this algorithm
introduces artificial time scales and recasts
the original DAE as PDE in time...More
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| Customers |
Tom
Brown, 12333, Weapons Surety; Ken Marx and Steve
Brandon, 8205, Weapons Engineering; Carolyn Bogdan,
1734, Component Information & Models. |
| Massively
Parallel |
- |
Current |
Q4FY04 |
| Key
Features |
Allows
the simulation of large circuits and electrical
systems at a level of fidelity...More
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| Customers |
Greg
Wickstrom, 02116, Surety Electronics & Software
(Use Control); Greg Lyons, 02616, Firing Set,
Fuze & Switch Tube (Nuclear Safety) |
| Entero
Coupling |
- |
Current |
Q4FY04 |
| Key
Features |
Interface
where analysts and designers can perform the hostile
environment simulation including modeling the
environment (using, for example, ITS) and its
impact on electrical systems performance. |
| Customers |
ASCI
Milestone; John Dye, 02331, Weapon Controllers |
| Circuit/Device
Coupling |
- |
Current |
Q4FY04 |
| Key
Features |
Provides
the possibiltiy to replace analog device models
with mesh-based PDE models which solve the drift-diffusion
formulation...More
|
| Customers |
Chuck
Hembree, 01749, Failure Analysis |
| Adjoint
Sensitivity/Optimization |
- |
Current |
Q4FY05 |
| Key
Features |
Xyce
has the capability to do "fast", intrusive
sensitivity and optimization analysis of electrical
problems via adjoint and direct methods...More
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| Customers |
Tom
Brown, 12333, Weapons Surety; Ken Marx and Steve
Brandon, 8205, Weapons Engineering; Carolyn Bogdan,
1734, Component Information & Models; Chuck
Hembree, 01749, Failure Analysis |
| Mixed
Digital/Analog Simulation |
Q1FY03 |
Q1FY04 |
Q4FY05 |
| Key
Features |
Parallel
mixed-signal simulation would allow electrical
systems designers to more fully characterize weapons
embedded electrical systems...More
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| Customers |
Tom
Brown, 12333, Weapons Surety; Ken Marx and Steve
Brandon, 8205, Weapons Engineering; Carolyn Bogdan,
1734, Component Information & Models; Chuck
Hembree, 01749, Failure Analysis |
| Predictive
Radiation-Aware Device |
- |
Current |
Photo
Current BJT, Diode - Q1FY04; Total Dose BSIM3
Q3FY04; Neutron BJT, Diode:QXFY0X |
| Key
Features |
Provides
a physics-based model of photocurrent effects
from high-intensity ionizing radiation...More.
For more
information on physics based device models,
please see User
Resources |
| Customers |
Tom
Brown, 12333, Weapons Surety; Ken Marx and Steve
Brandon, 8205, Weapons Engineering; Carolyn Bogdan,
1734, Component Information & Models; Chuck
Hembree, 01749, Failure Analysis |
| Adaptive
Checkpointing/Restart |
- |
- |
Current |
| Key
Features |
Provides
job restart due to instabilites in the convergence
behavior or platforms which may cause interruptions
for long simulation runs. Checkpoint interval
may be varied through the run to better adapt
to the circuit dynamics. |
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